Contributing USMA Research Unit(s)
Electrical Engineering and Computer Science, Photonics Research Center
Publication Date
10-2015
Publication Title
OSA Technical Digest (online) (Optica Publishing Group, 2015), paper JW2A.30
Document Type
Conference Proceeding
Abstract
We report on M2 measurements taken for on-wafer vertical cavity surface emitting lasers (VCSELs). We measured M2 for oxide-confined VCSELs and photonic crystal (PhC) VCSELs of similar lasing aperture sizes.
Recommended Citation
William North, CDT David Chacko, CDT Peter Zeidler, Janice Blane, Kirk Ingold, Brian Souhan, and James J. Raftery, Jr. “Measuring M2 values for on-wafer vertical cavity surface emitting lasers,” in Frontiers in Optics/Laser Science 2015, Optical Society of America, San Jose, CA (October 2015); doi:10.1364/FIO.2015.JW2A.30