Loss and Accuracy of the Photonic Crystal Model in Holey VCSELs
Contributing USMA Research Unit(s)
Electrical Engineering and Computer Science
(CLEO). Conference on Lasers and Electro-Optics, 2005.
A comprehensive parametric study of VCSELs incorporating etched holes for lateral confinement was conducted. Results from over two thousand devices reveal the role of loss and verify the predictive abilities of the photonic crystal model.
A. J. Danner, J. J. Raftery, Jr., P. O. Leisher, E. A. Yamaoka, S. R. Lala, M. L. Hwang, and K. D. Choquette, “Loss and Accuracy of the Photonic Crystal Model in Holey VCSELs,” CLEO (Conference on Lasers and Electro-Optics), Baltimore, MD, USA (May 2005).
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