Title
Loss and Accuracy of the Photonic Crystal Model in Holey VCSELs
Contributing USMA Research Unit(s)
Electrical Engineering and Computer Science
Publication Date
5-2005
Publication Title
(CLEO). Conference on Lasers and Electro-Optics, 2005.
Document Type
Conference Proceeding
Abstract
A comprehensive parametric study of VCSELs incorporating etched holes for lateral confinement was conducted. Results from over two thousand devices reveal the role of loss and verify the predictive abilities of the photonic crystal model.
Recommended Citation
A. J. Danner, J. J. Raftery, Jr., P. O. Leisher, E. A. Yamaoka, S. R. Lala, M. L. Hwang, and K. D. Choquette, “Loss and Accuracy of the Photonic Crystal Model in Holey VCSELs,” CLEO (Conference on Lasers and Electro-Optics), Baltimore, MD, USA (May 2005).
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