Title
Beam Quality Factor Analysis of On-Wafer Vertical Cavity Surface Emitting Lasers
Contributing USMA Research Unit(s)
Electrical Engineering and Computer Science, Photonics Research Center
Publication Date
5-2008
Publication Title
2018 Conference on Lasers and Electro-Optics (CLEO), 2018, p.1-2
Document Type
Conference Proceeding
Abstract
We report on a method for analyzing the beam quality factor of on-wafer vertical cavity surface emitting lasers (VCSEL) leading to an M 2 min-max for each measured device due to asymmetry in the beam profile.
Recommended Citation
K. A. Ingold, CDT J. D. Tate, J. B. Groen, B. Souhan, and J. J. Raftery Jr., "Beam Quality Factor Analysis of On-Wafer Vertical Cavity Surface Emitting Lasers," 2018 Conference on Lasers and Electro-Optics (CLEO), San Jose, CA (May 2018).
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